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安捷倫科技（中國）有限公司
Interferometry: Technology and Applications光學干涉顯微鏡的原理及應用介紹。本文詳盡地介紹了光學輪廓儀的技術理論基礎，分析方法。同時列舉除了光學干涉技術在不通領域里的應用實例及測試結果。本文簡單易懂，...
樣品：未知 項目：未知
產品配置：1臺儀器，0個耗材，0個試劑
Nanoindenting, Scratching, and Wear Testing with the Atomic Force MicroscopeNanoindentation is an option for Digital Instruments MultiMode and Dimension; Series Scanning Probe Microscopes (SPMs). Usin...
樣品：膜 項目：納米識別、刮痕、磨損檢測
產品配置：1臺儀器，0個耗材，0個試劑
用原子力顯微鏡研究金屬表面及其微結構Reliable, localized measurements of microstructural parameters are of great relevance for developing new alloys, and for quality control in manufacturing processes....
樣品：金屬 項目：金屬表面及其微結構
產品配置：1臺儀器，0個耗材，0個試劑
3D MEMS Metrology with the Atomic Force MicroscopeThe AFM creates 3-dimensional images of a surface, covering, typically, an area up to 120µm square and height variations up to 7um. It enabl...
樣品：3D MEM 項目：3D MEM加工
產品配置：1臺儀器，0個耗材，0個試劑
Force modulation imaging is an atomic force microscopy (AFM) technique that identifies and maps differences in surface stiffness or elasticity1. It is one of several techniques developed as extensions...
樣品：拋光的連接部分carbon/epoxy 組成，在aeronautics, bicycle frames, and golf clubs 項目：localized studies of relative difference in surface elasticity with nanometer-scale resolution
產品配置：1臺儀器，0個耗材，0個試劑
The described High Temperature Heater Accessory for the Digital Instruments MultiMode AFM meets the strong demand for AFM measurements at elevated temperatures. The accessory accommodates several new...
樣品：高分子聚合物 項目：高分子聚合物
產品配置：1臺儀器，0個耗材，0個試劑
